The ATVS-2030™Automatic Temperature & Velocity Scanner is a patented, multi-channel hot wire anemometer system for single or multi-point measuring of humidity, surface temperature, air temperature, and velocity.

The unique, patented candlestick sensors are designed to be flexible, robust and low profile to minimize flow disturbance. They can be easily placed anywhere in the test domain. The use of a single sensor to measure both temperature and velocity at a single point eliminates errors introduced because of the flow being non-isothermal.

Great care is taken in the calibration process of each sensor. The system can accommodate up to 30 channels (sensors) for easy and accurate mapping of the velocity and temperature fields of the test domain, and features a humidity sensor port.

Its portable design and compact dimensions make it an ideal choice for various applications. The system requires a PC for operation and seamlessly interfaces with the included stageVIEW™ software for intuitive data acquisition and reporting.

| Product Specifications

• OVERALL DIMENSIONS (D x W x H) : 28.5 cm x 37.4 cm x 10.9 cm (11.2" x 14.7" x 4.3")
• TEMPERATURE RANGE : -30℃ to 150℃ (-22℉ to 302℉) (±1℃)
• FLOW RANGE : 0 to 50 m/s (0 to 10,000 ft/min) (± 3%)
• HUMIDITY : +/- 2% AT 55% RH
• NUMBER OF CHANNELS : 30 + 1 Humidity Sensor Channel
• SOFTWARE : StageVIEW™
• CONNECTIONS : USB port 2.0, Wi-Fi, Ethernet
• POWER : 110V or 220V
• WEIGHT : 3.8 kg (8.4 lbs.)

| Applications

• Surface and Air Temperature Measurement
• Velocity Measurement
• Heat Sink Characterization
• PCB Testing
• Heat Sink Comparison
• Wind Tunnel Testing
• Thermal Characterization Studies

| Additional Features

• Single Sensor Technology
• Accuracy and Ease of Use
• Up to 30 Sensors
• Humidity Sensor
• Remote Access
• Connection
• stageVIEW™ Software

| Product and How To Videos

The families of ATS thermal test instruments for the electronics industry.	Demos of stageVIEW Software used with eATVS Temperature and Velocity Scanners.	CLWT-067-PCIe™ - Closed Loop Wind Tunnel for PCIe Characterization

| 자료실

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