Introspect

DDR Memory Interfaces
DisplayPort
PCI Express
MIPI Physical Layers
MIPI Camera and Imaging
MIPI Display and Touch
MIPI Control and Data
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MIPI I3C Design and Test
- Probe Products
- • PV2 Universal Active Probe
- • PV1 Universal Active Probe
- Digital IO Test Modules
- • SV6E-X: SoundWire
- • SV6E-X Mid-Frequency...
- • PurVue Analyzer™
- Software Solutions
- • I3C Controller
- • I3C Target
Manufacturing Test
Analog Test and Mea...
Clocks and Timers

| MIPI I3C Design and Test

제품 정보

Introspect 제품

MIPI I3C Design and Test

A sensor interface for mobile, IoT, and automotive system designs
| Probe Products | Digital IO Test Modules | Software Solutions |

견적 요청 자료실

| 제품 설명

MIPI® I3C℠ is a bus interface for interconnecting peripheral devices such as sensors to microcontrollers or applications processors. Building on the decades old I2C and SPI interfaces, MIPI I3C provides a modern, low-power, and unified interface that is manufactured using standard CMOS technology. Still using a 2-wire bus, it supports transfer speeds in excess of 10 Mbps, and it offers unique features such as dynamic master definition and dynamic addressing.

With I3C technology, we’re able to reach a much higher level of performance, albeit not without new design and validation challenges. For example, the high operating rates mean that test tools need to achieve timing resolutions in the nanosecond range while remaining cost-effective for mass deployment. What’s more, the dynamic nature of the bus creates a great deal of complexity in the associated state machines, necessitating the need for complete, hardware-based test tools. You’ll find no better I3C design and test instruments than those offered by Introspect Technology for addressing these challenges and more.

Industry Challenges

Introspect Capability

- High operating speeds when compared to I2C
- Complex state machines
- SDR and HDR operating modes
- Dynamic addressing and dynamic master selection
- Multiple bus configurations

- High-performance modules with nanosecond timing resolution
- High-performance and cost-effective probing solutions
- Device emulation of masters, slaves, or multi-mode end points
- Passive protocol analysis (sniffing) of any I3C bus
- Features for characterization and screening
- PurVue Analyzer™ : Brand new I3C protocol-triggered real-time oscilloscope compatible with SV6E-X Mid-Frequency Digital Test Module, thus eliminating the need for external active probes or benchtop oscilloscopes.

| Probe Products

	PV2 Universal Active Probe	Probing Solution with 8 GHz Bandwidth
	PV1 Universal Active Probe	Probing Solution with 5 GHz Bandwidth

| Digital IO Test Modules

	SV6E-X: SoundWire	Enabling high performance testing of SoundWire
	SV6E-X Mid-Frequency Digital Test Module	Multi-protocol digital exerciser and analyzer with 200 MHz I/O speeds
	PurVue Analyzer™	Highly Commended Embedded Real-time Oscilloscope for SV6E-X

| Software Solutions

	I3C Controller	Enabling high performance testing of SoundWire
	I3C Target	Multi-protocol digital exerciser and analyzer with 200 MHz I/O speeds

| 자료실

제 목	파일 다운로드
[제품 사양서] SV6E-X 제품 사양서	PDF
DDR5 DIMM 메모리의 기능테스트(Functional Test) 방법을 소개합니다.	PDF
DDR SPD Hub Device 검증방법 알아보기	PDF
[소개자료] High Speed Digital 솔루션의 강자 Introspect를 소개합니다.	PDF

J-Link Hardware Series

J-Link Software Series

J-Link System Series

Inter-Connection 솔루션

Probe 솔루션

RF 스위치 시스템

배터리 테스터 솔루션

유전율 측정 솔루션

Cable 검사 솔루션

Pre-Compliance Test 솔루션

임피던스/TDR 솔루션

측정자동화(ATE) 솔루션

Keysight Functional Test System