PCI Express

| 제품 설명

Industry Challenges	Introspect Capability
- Extremely high data rates - Large channel counts - Closed-eye receiver jitter tolerance testing - Stringent transmitter eye testing - Complex channel topologies - Complex link equalization training algorithms	- Up to 32 Gbps coverage for Gen5 development - Up to 32 lanes per tester - Integrated per lane jitter injection and voltage noise injection - Integrated, per lane hardware-based clock and data recovery (CDR) - Integrated, per lane de-emphasis generation - Flexible pattern generation and training state machines

| DDR & GDDR Exercisers

SV7C Personalized SerDes Tester

All-in-one, phase-aligned bit error rate tester (BERT) and protocol exerciser and analyzer

| Serial & Parallel BERTs

	SV3C-14 Personalized SerDes Tester	Highly parallel tester for DDR, clock forwarded, & embedded clock applications up to 14.1 Gbps
	SV3C-12 Personalized SerDes Tester	Highly parallel tester for DDR, clock forwarded, and embedded clock applications up to 12.5 Gbps
	SV3C-8 Personalized SerDes Tester	Highly parallel tester for DDR, clock forwarded, and embedded clock applications up to 8 Gbps
	SV3C-4 Personalized SerDes Tester	Highly parallel tester for DDR, clock forwarded, and embedded clock applications up to 4 Gbps
	SV1C-14 Personalized SerDes Tester	SerDes tester for clock forwarded and embedded clock applications up to 14.1 Gbps
	SV1C-12 Personalized SerDes Tester	SerDes tester for clock forwarded and embedded clock applications up to 12.5 Gbps
	SV1C-8 Personalized SerDes Tester	SerDes tester for applications up to 8 Gbps
	SV1C-4 Personalized SerDes Tester	SerDes tester for applications up to 4 Gbps

| Probe Products

	RSH2 Remote Sampling Head	12 Active Probes Integrated Into a Clean, Shielded Form Factor
	RSH1 Remote Sampling Head	Clean Probing of Parallel Buses
	PV2 Universal Active Probe	Probing Solution with 8 GHz Bandwidth
	PV1 Universal Active Probe	Probing Solution with 5 GHz Bandwidth

| Test Modules

	SV3D-14 Direct Attach SerDes Test Module	Ultra-compact 32 lane test module for mounting on any application board (14.1 Gbps)
	SV3D-12 Direct Attach SerDes Test Module	Ultra-compact 32 lane test module for mounting on any application board (12.5 Gbps)
	SV3D-8 Direct Attach SerDes Test Module	Ultra-compact 32 lane test module for mounting on any application board (8 Gbps)
	SV3D-4	Ultra-compact 32 lane test module for mounting on any application board (4 Gbps)
	SV1D-14 Direct Attach SerDes Test Module	Mounts directly on an ATE load board (14 Gbps)
	SV1D-12 Direct Attach SerDes Test Module	Highly integrated tester that mounts directly on an ATE load board (12.5 Gbps)
	SV1D-4	Highly integrated tester that mounts directly on an ATE load board (4 Gbps)

| 자료실

제    목	파일 다운로드
[제품 사양서] SV6E-X 제품 사양서	PDF
DDR5 DIMM 메모리의 기능테스트(Functional Test) 방법을 소개합니다.	PDF
DDR SPD Hub Device 검증방법 알아보기	PDF
[소개자료] High Speed Digital 솔루션의 강자 Introspect를 소개합니다.	PDF