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| DDR Memory Interfaces

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DDR Memory Interfaces

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Representing the fastest growing segment of the semiconductor industry, memory technology continues to rapidly improve on density, efficiency, and transfer rates. When it comes to building the latest generation double-data-rate (DDR) memory interfaces, developers face unprecedented challenges during both the design verification and interface characterization phases. On one hand, DDR interfaces are single-ended and require a great deal of signal traces for a single memory device; and on the other hand, the latest standards such as DDR4 and DDR5 require extremely accurate measurement setups and include receiver stress requirements.

Introspect Technology’s highly parallel pattern generator and signal analyzer solutions are ideal for DDR4 and DDR5 interface tests. Our solutions contain a wide host of protocol features and physical layer features that are particularly tuned for DDR applications. What’s more, all of these features are offered at extremely competitive prices for CPU makers, interface makers, DRAM makers, and system integrators.

Industry Challenges Introspect Capability
- High data rates
- Large channel counts
- Tight skew requirements
- Single-ended
- Deterministic pattern timings
 - Up to 12.5 Gbps in the DDR relevant testers
- Up to 112 channels in a configured setup
- Deterministic, high-precision skew control
- Pattern timeline technology
- PurVue Analyzer™: Brand new I3C protocol-triggered real-time oscilloscope compatible with SV6E-X Mid-Frequency Digital Test Module, thus eliminating the need for external active probes or benchtop oscilloscopes.

| DDR & GDDR Exercisers

SV7C Personalized SerDes Tester All-in-one, phase-aligned bit error rate tester (BERT) and protocol exerciser and analyzer

| Serial & Parallel BERTs

SV7C-PAM3 12-Channel, PAM3 Bit Error Rate Tester Highly Integrated BERT for GDDR7, USB4 Gen2, and more

| Probe Products

RSH2 Remote Sampling Head 12 Active Probes Integrated Into a Clean, Shielded Form Factor
RSH1 Remote Sampling Head Clean Probing of Parallel Buses

| Memory Test Systems

M5512 GDDR7 Memory Test System Award-winning ATE-on-Bench for GDDR7 Characterization and Test

| Protocol Analyzers

SV7M-LPDDR5PA LPDDR5 Protocol Analyzer High-Performance Debug, Compliance Validation, and Analysis

| Software Solutions

DDR5 SPD Device Hub CTS Highly Integrated BERT for GDDR7, USB4 Gen2, and more
DDR5 RCD Sidebandbus Highly Integrated BERT for GDDR7, USB4 Gen2, and more

| Video Demo

Pattern Timelines for DDR4/DDR5 Testing
PV2 8 GHz Active Probe Introduction

| 자료실

제    목 파일 다운로드
[제품사양서] MIPI D -PHY / C -PHY Analyzer PDF
[제품사양서] MIPI D -PHY / C -PHY Generator PDF
[솔루션] Oscilloscpe Probing Solution - Integrated-Tip Interposer for Memory Devices PDF
[제품사양서] M7030 DDR/LPDDR Protocol Analyzer PDF
[제품정보] DDR5의 Input Clock Jitter 테스트 하기 PDF
[제품정보] DDR5/LPDDR5 를 넘어 DDR6/LPDDR6 프로토콜 분석 솔루션을 소개 - 제품정보 PDF
[제품정보] DDR5/LPDDR5 를 넘어 DDR6/LPDDR6 프로토콜 분석 솔루션을 소개 - 인터포저 솔루션 PDF
[제품정보] SV7M-DDRPA LPDDR5 Protocol Analyzer Data Sheet PDF
[제품정보] SV7M-DDRPA LPDDR5 Protocol Analyzer Product Brief PDF
[Introspect] DDR 메모리 Probing용 새로운 Interposer를 소개합니다. PDF
[동영상] SV5C-DPRXCPRX: High-Performance Combo MIPI D-PHY and C-PHY Analyzer AVI
[동영상] SV5C-DPTXCPTX Combo MIPI D-PHY/C-PHY Generator AVI
[Introspect] MIPI D-PHY/C-PHY 솔루션을 소개해 드립니다. PDF
[제품 사양서] SV6E-X 제품 사양서 PDF
DDR5 DIMM 메모리의 기능테스트(Functional Test) 방법을 소개합니다. PDF
DDR SPD Hub Device 검증방법 알아보기 PDF
[소개자료] High Speed Digital 솔루션의 강자 Introspect를 소개합니다. PDF
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