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| Analog Test and Measurement

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Analog Test and Measurement

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High-speed systems rely on a great deal of analog content in order to process signals and data properly. Whether it is the very low voltage regulators powering a system or the various digital to analog converters (DACs) and analog to digital converters (ADCs), these systems require accurate and low noise tools for measurement and verification.

Introspect Technology products are used regularly in analog and mixed-signal paradigms. For example, Modem chipsets converting RF signals into digital (and vice versa) often rely on a mix of analog sections and SerDes sections. Similarly, low voltage power delivery network (PDN) design and optimization benefits from our various hardware probing and software processing solutions.

Industry Challenges Introspect Capability
- Mixed-signal analog and digital chains
- System-level interaction between analog and digital
- Very low voltage levels
- Very low noise levels
- SerDes tools for generating or receiving real-time data converter traffic
- Low voltage probing solutions
- Sophisticated software tools for mixed-domain time and frequency analysis
- PurVue Analyzer™: Brand new I3C protocol-triggered real-time oscilloscope compatible with SV4E-I3C I3C Test and Debug Module, thus eliminating the need for external active probes or benchtop oscilloscopes.

| DDR & GDDR Exercisers

SV7C Personalized SerDes Tester All-in-one, phase-aligned bit error rate tester (BERT) and protocol exerciser and analyzer

| Serial & Parallel BERTs

SV3C-4 Personalized SerDes Tester Highly parallel tester for DDR, clock forwarded, and embedded clock applications up to 4 Gbps
SV2C-32 Personalized SerDes Tester 8-Lane, 32 Gbps for high-end SerDes applications
SV1C-14 Personalized SerDes Tester SerDes tester for clock forwarded and embedded clock applications up to 14.1 Gbps
SV1C-12 Personalized SerDes Tester SerDes tester for clock forwarded and embedded clock applications up to 12.5 Gbps
SV1C-8 Personalized SerDes Tester SerDes tester for applications up to 8 Gbps
SV1C-4 Personalized SerDes Tester SerDes tester for applications up to 4 Gbps

| Probe Products

RSH2 Remote Sampling Head 12 Active Probes Integrated Into a Clean, Shielded Form Factor
RSH1 Remote Sampling Head Clean Probing of Parallel Buses
PV2 Universal Active Probe Probing Solution with 8 GHz Bandwidth
PV1 Universal Active Probe Probing Solution with 5 GHz Bandwidth

| Test Modules

SV3D-14 Direct Attach SerDes Test Module Ultra-compact 32 lane test module for mounting on any application board (14.1 Gbps)
SV3D-12 Direct Attach SerDes Test Module Ultra-compact 32 lane test module for mounting on any application board (12.5 Gbps)
SV3D-8 Direct Attach SerDes Test Module Ultra-compact 32 lane test module for mounting on any application board (8 Gbps)
SV3D-4 Ultra-compact 32 lane test module for mounting on any application board (4 Gbps)
SV2D-32 Direct Attach SerDes Test Module High-performance tester that mounts directly on any load board (32 Gbps)
SV1D-4 Highly integrated tester that mounts directly on an ATE load board (4 Gbps)

| Digital IO Test Modules

PurVue Analyzer™ Highly Commended Embedded Real-time Oscilloscope for SV6E-X

| Video Demo

PV2 8 GHz Active Probe Introduction

| 자료실

제    목 파일 다운로드
[제품 사양서] SV6E-X 제품 사양서 PDF
DDR5 DIMM 메모리의 기능테스트(Functional Test) 방법을 소개합니다. PDF
DDR SPD Hub Device 검증방법 알아보기 PDF
[소개자료] High Speed Digital 솔루션의 강자 Introspect를 소개합니다. PDF